Browsing by Keywords "Dielectric properties"
Now showing items 1-13 of 13
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Analysis of an arbitrary profile reflector antenna having resistive-type surface-H-polarization case
(IEEE, 2008-06-07)A regularization-based numerical solution is obtained for arbitrary-shape conic section profile reflector antenna in 2-D, for the H-polarization case. New point is that the reflector surface is assumed a resistive-type ... -
Differential charging in x-ray photoelectron spectroscopy: a nuisance or a useful tool?
(American Chemical Society, 2003)We apply a negative bias to the sample while recording an XPS spectrum to enhance differential (positive) charging. The enhanced differential charging is due to the repulsion of stray electrons from the sample, which ... -
Electrical conduction and dielectric relaxation properties of AlN thin films grown by hollow-cathode plasma-assisted atomic layer deposition
(Institute of Physics Publishing, 2016)In this study, aluminum nitride (AlN) thin films were deposited at 200 �C, on p-type silicon substrates utilizing a capacitively coupled hollow-cathode plasma source integrated atomic layer deposition (ALD) reactor. The ... -
Frequency and temperature dependence of the dielectric and AC electrical conductivity in (Ni/Au)/AlGaN/AlN/GaN heterostructures
(Elsevier, 2010)The dielectric properties and AC electrical conductivity (σ ac)of the (Ni/Au)/Al 0.22Ga 0.78N/AlN/GaN heterostructures, with and without the SiNx passivation, have been investigated by capacitance-voltage and conductance-voltage ... -
Methods for probing charging properties of polymeric materials using XPS
(2010)Various thin polystyrene, PS, and poly(methyl methacrylate), PMMA and PS + PMMA blend films have been examined using the technique of recording X-ray photoelectron spectrum while the sample is subjected to ±10 V d.c. bias, ... -
Photonic band gaps with layer-by-layer double-etched structures
(A I P Publishing LLC, 1996-09-03)Periodic layer‐by‐layer dielectric structures with full three‐dimensional photonic band gaps have been designed and fabricated. In contrast to previous layer‐by‐layer structures the rods in each successive layer are at an ... -
Plasma-enhanced atomic layer deposition of amorphous Ga2O3 gate dielectrics
(Elsevier Ltd, 2022-08-30)Amorphous gallium oxide (Ga2O3) thin films were investigated as gate dielectrics for electronic device applications using plasma-enhanced atomic layer deposition. The structural and morphological properties as well as the ... -
Plasmonic materials based on ZnO films and their potential for developing broadband middle-infrared absorbers
(American Institute of Physics Inc., 2014)Noble metals such as gold and silver have been extensively used for plasmonic applications due to their ability to support plasmons, yet they suffer from high intrinsic losses. Alternative plasmonic materials that offer ... -
Simulation of an integrated microfluidic device for bioparticle wash, separation and concentration
(American Society of Mechanical Engineers (ASME), 2013)Washing, separation and concentration of bioparticles are key operations for many biological and chemical analyses. In this study, the simulation of an integrated microfluidic device is studied. The proposed device has the ... -
Time-resolved XPS analysis of the SiO2/Si system in the millisecond range
(2004)By applying voltage pulses to the sample rod while recording the spectrum, we show, for the first time, that it is possible to obtain a time-resolved XPS spectrum in the millisecond range. The Si 2p spectrum of a silicon ... -
Understanding the plasmonic properties of dewetting formed Ag nanoparticles for large area solar cell applications
(Optical Society of American (OSA), 2013)The effects of substrates with technological interest for solar cell industry are examined on the plasmonic properties of Ag nanoparticles fabricated by dewetting technique. Both surface matching (boundary element) and ... -
XPS analysis with pulsed voltage stimuli
(2006)We record XPS spectra while applying 0 to +10 V or 0 to -10 V square pulses to the sample rod, which normally results in twinning of all peaks at correspondingly increased (for +10 V) or decreased (for -10 V) binding ... -
XPS measurements for probing dynamics of charging
(Elsevier, 2010)The technique of recording X-ray photoemission data while the sample rod is subjected to ±10.0 V (dc) or square-wave pulses (ac) with varying frequencies in the range of 10-3 to 103 Hz for probing charging/discharging ...
