Browsing by Keywords "Band-bending"
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Band-Bending at buried SiO2/Si interface as probed by XPS
(American Chemical Society, 2013)X-ray photoelectron spectroscopy is used to probe the photoinduced shifts in the binding energies of Si2p, O1s, and C1s of the SiO2/Si interfaces of a number of samples having oxide and/or thin organic layers on top of p- ...