Browsing by Author "Tanrikulu, M. Y."

Now showing items 1-4 of 4

    • An all-ZnO microbolometer for infrared imaging 

      Kesim, Y. E.; Battal, E.; Tanrikulu, M. Y.; Okyay, Ali Kemal (Elsevier BV, 2014)
      Microbolometers are extensively used for uncooled infrared imaging applications. These imaging units generally employ vanadium oxide or amorphous silicon as the active layer and silicon nitride as the absorber layer. ...

    • Atomic layer deposition synthesized TiOx thin films and their application as microbolometer active materials 

      Tanrikulu, M. Y.; Rasouli, H. R.; Ghaffari, M.; Topalli K.; Okyay, Ali Kemal (AVS Science and Technology Society, 2016)
      This paper demonstrates the possible usage of TiOx thin films synthesized by atomic layer deposition as a microbolometer active material. Thin film electrical resistance is investigated as a function of thermal annealing. ...

    • Atomic-layer-deposited zinc oxide as tunable uncooled infrared microbolometer material 

      Battal, E.; Bolat, S.; Tanrikulu, M. Y.; Okyay, Ali Kemal; Akin, T. (Wiley-VCH Verlag, 2014)
      ZnO is an attractive material for both electrical and optical applications due to its wide bandgap of 3.37 eV and tunable electrical properties. Here, we investigate the application potential of atomic-layer-deposited ZnO ...

    • LWIR all-atomic layer deposition ZnO bilayer microbolometer for thermal imaging 

      Poyraz, M.; Gorgulu, K.; Sisman, Z.; Tanrikulu, M. Y.; Okyay, Ali Kemal (SPIE, 2017)
      We propose an all-ZnO bilayer microbolometer, operating in the long-wave infrared regime that can be implemented by consecutive atomic layer deposition growth steps. Bilayer design of the bolometer provides very high ...