Browsing by Author "Sezen, H."
Now showing items 1-17 of 17
-
Band-Bending at buried SiO2/Si interface as probed by XPS
(American Chemical Society, 2013)X-ray photoelectron spectroscopy is used to probe the photoinduced shifts in the binding energies of Si2p, O1s, and C1s of the SiO2/Si interfaces of a number of samples having oxide and/or thin organic layers on top of p- ... -
Charge storage and release onto Au and Ag nanoparticles in aqueous medium as probed by optical spectroscopy
(Cognizure, 2014)Gold and silver nanoparticles in aqueous solutions can store negative or positive charges when, respectively, NaBH4, KI are introduced into the same media. The charge storage can be followed by the spectral shifts in the ... -
Charging / discharging of thin PS / PMMA films as probed by dynamic x-ray photoelectron spectroscopy
(2007)Polystyrene / polymethyl methacrylate (PS-PMMA) thin films were analyzed for detecting phase separation as well as probing their electrical responses by XPS. It was also shown that electrical parameters like resistance or ... -
Charging/discharging dynamics of CdS and CdSe films under photoillumination using dynamic x-ray photoelectron spectroscopy
(A I P Publishing LLC, 2010)Thin films of CdS and CdSe are deposited on HF-cleaned Si O2 /Si substrates containing ∼5 nm thermally grown silicon oxide. x-ray photoelectron spectroscopy (XPS) data of these films are collected in a dynamic mode, which ... -
Communication: Enhancement of dopant dependent x-ray photoelectron spectroscopy peak shifts of Si by surface photovoltage
(2011)Binding energies measured by x-ray photoelectron spectroscopy (XPS) are influenced by doping, since electrons are transferred to (p-type) and from (n-type) samples when they are introduced into the spectrometer, or brought ... -
Dynamical XPS measurements for probing photoinduced voltage changes
(2010)Photoillumination with 405 nm laser causes shifts in XPS peaks of n-Si(100), and CdS. To distinguish between surface photovoltage (SPV), and charging, dynamical measurements are performed, while sample is subjected to ... -
Location and visualization of working p-n and/or n-p junctions by XPS
(Nature Publishing Group, 2016)X-ray photoelectron spectroscopy (XPS) is used to follow some of the electrical properties of a segmented silicon photodetector, fabricated in a p-n-p configuration, during operation under various biasing configurations. ... -
Methods for probing charging properties of polymeric materials using XPS
(2010)Various thin polystyrene, PS, and poly(methyl methacrylate), PMMA and PS + PMMA blend films have been examined using the technique of recording X-ray photoelectron spectrum while the sample is subjected to ±10 V d.c. bias, ... -
Optical response of Ag-Au bimetallic nanoparticles to electron storage in aqueous medium
(2008)Composition and structure dependence of the shift in the position of the surface plasmon resonance band upon introduction of NaBH 4 to aqueous solutions of gold and silver nanoparticles are presented. Silver and gold ... -
Probing dynamics of surface structures using x-ray photoelectron spectroscopy
(Simplex Academic, 2012)By incorporating laser illumination, and/or by application of electrical square-wave pulses to the sample, X-ray photoelectron spectroscopy is utilized to probe the dynamics of the surface structures in the range of 10-3 ... -
Probing the charge build-up and dissipation on thin PMMA film surfaces at the molecular level by XPS
(Wiley, 2012)What's the charge? X‐ray photoelectron spectroscopy was used to determine the charge state and dynamics of charge build‐up and decay on a thin poly(methyl methacrylate) film. The film is initially negatively charged to ... -
Transient surface photovoltage in n-and p-GaN as probed by x-ray photoelectron spectroscopy
(2011)Transient surface photovoltage (SPV) of n and p-GaN was measured using x-ray photoelectron spectroscopy (XPS) with a time resolution of 0.1 s. The measured SPV transients for both n- and p-GaN are 0.1 s, and for the n-GaN ... -
Two-dimensional x-ray photoelectron spectroscopy for composite surface analysis
(2008)We describe a method for obtaining two-dimensional X-ray photoelectron spectroscopic data derived from the frequency dependence of the XPS peaks recorded under electrical square-wave pulses, which control and affect the ... -
XPS for chemical-and charge-sensitive analyses
(Elsevier, 2013-05-01)By recording X-ray photoelectron spectroscopic binding energy shifts, while subjecting samples to a variety of optical and electrical stimuli, information about charge accumulation on materials or surface structures can be ... -
XPS for probing the dynamics of surface voltage and photovoltage in GaN
(Elsevier, 2014-12-30)We describe application of two different data gathering techniques of XPS for probing the dynamics of surface voltage and surface photovoltage (SPV) developed in microseconds to seconds time-domain, in addition to the ... -
XPS investigation of a CdS-Based photoresistor under working conditions: operando − XPS
(American Chemical Society, 2012)A noncontact chemical and electrical measurement X-ray photoelectron spectroscopy (XPS) technique is performed to investigate a CdS-based photoresistor during its operation. The main objective of the technique is to ... -
XPS measurements for probing dynamics of charging
(Elsevier, 2010)The technique of recording X-ray photoemission data while the sample rod is subjected to ±10.0 V (dc) or square-wave pulses (ac) with varying frequencies in the range of 10-3 to 103 Hz for probing charging/discharging ...
