Now showing items 1-14 of 14

    • 3D Force field spectroscopy 

      Baykara, Mehmet Z.; Schwarz, U. D. (Springer, Cham, 2015)
      With recent advances in instrumentation and experimental methodology, noncontact atomic force microscopy is now being frequently used to measure the atomic-scale interactions acting between a sharp probe tip and surfaces ...
    • Advanced atomic force microscopy techniques 

      Glatzel, T.; Holscher, H.; Schimmel, T.; Baykara, M. Z.; Schwarz, U. D.; Garcia, R. (Beilstein - Institut zur Foerderung der Chemischen Wissenschaften, 2012-12-21)
      Although its conceptual approach is as simple as the technique used in record players already introduced in the 19th century, the invention of the atomic force microscope (AFM) in 1986 by Binnig, Quate, and Gerber was a ...
    • Atom-specific forces and defect identification on surface-oxidized Cu ( 100 ) with combined 3D-AFM and STM measurements 

      Baykara, M. Z.; Todorović, M.; Mönig, H.; Schwendemann, T. C.; Ünverdi, Ö.; Rodrigo, L.; Altman, E. I.; Pérez, R.; Schwarz, U. D. (American Physical Society, 2013)
      The influence of defects on the local structural, electronic, and chemical properties of a surface oxide on Cu(100) were investigated using atomic resolution three-dimensional force mapping combined with tunneling current ...
    • Atomic force microscopy: Methods and applications 

      Baykara, Mehmet Z.; Schwarz, U. D. (Elsevier, 2017)
      This chapter provides an overview of atomic force microscopy, covering the fundamental aspects of the associated instrumentation and methodology as well as representative results from the literature highlighting a variety ...
    • Exploring atomic-scale lateral forces in the attractive regime: a case study on graphite (0001) 

      Baykara, M. Z.; Schwendemann, T. C.; Albers, B. J.; Pilet, N.; Mönig, H.; Altman, E. I.; Schwarz, U. D. (Institute of Physics Publishing, 2012)
      A non-contact atomic force microscopy-based method has been used to map the static lateral forces exerted on an atomically sharp Pt/Ir probe tip by a graphite surface. With measurements carried out at low temperatures and ...
    • Low-temperature scanning probe microscopy 

      Baykara, Mehmet Z.; Morgenstern, M.; Schwarz, A.; Schwarz, U. D. (Springer, 2017)
      This chapter is dedicated to scanning probe microscopy (SPM ) operated at cryogenic temperatures, where the more fundamental aspects of phenomena important in the fields of nanoscience and nanotechnology can be investigated ...
    • Noncontact atomic force microscopy II 

      Baykara, M. Z.; Schwarz, U. D. (Beilstein-Institut Zur Forderung der Chemischen Wissenschaften, 2014)
    • Noncontact atomic force microscopy III 

      Baykara, M. Z.; Schwarz, U. D. (Beilstein-Institut Zur Forderung der Chemischen Wissenschaften, 2016-06)
    • Noncontact atomic force microscopy: an emerging tool for fundamental catalysis research 

      Altman, E. I.; Baykara, M. Z.; Schwarz, U. D. (American Chemical Society, 2015)
      ConspectusAlthough atomic force microscopy (AFM) was rapidly adopted as a routine surface imaging apparatus after its introduction in 1986, it has not been widely used in catalysis research. The reason is that common AFM ...
    • Nonuniform friction-area dependency for antimony oxide surfaces sliding on graphite 

      Ritter, C.; Baykara, M. Z.; Stegemann, B.; Heyde, M.; Rademann, K.; Schroers, J.; Schwarz, U. D. (American Physical Society, 2013)
      We present frictional measurements involving controlled lateral manipulation of antimony nanoparticles on graphite featuring atomically smooth particle-substrate interfaces via tapping- and contact-mode atomic force ...
    • Probing three-dimensional surface force fields with atomic resolution: measurement strategies, limitations, and artifact reduction 

      Baykara, M. Z.; Dagdeviren, O. E.; Schwendemann, T. C.; Mönig, H.; Altman, E. I.; Schwarz, U. D. (Beilstein - Institut zur Foerderung der Chemischen Wissenschaften, 2012)
      Noncontact atomic force microscopy (NC-AFM) is being increasingly used to measure the interaction force between an atomically sharp probe tip and surfaces of interest, as a function of the three spatial dimensions, with ...
    • Simultaneous measurement of multiple independent atomic-scale interactions using scanning probe microscopy: data interpretation and the effect of cross-talk 

      Baykara, M. Z.; Todorović, M.; Mönig, H.; Schwendemann, T. C.; Rodrigo, L.; Altman, E. I.; Pérez, R.; Schwarz, U. D. (American Chemical Society, 2015)
      In high-resolution scanning probe microscopy, it is becoming increasingly common to simultaneously record multiple channels representing different tip-sample interactions to collect complementary information about the ...
    • Three-dimensional interaction force and tunneling current spectroscopy of point defects on rutile TiO2(110) 

      Baykara, M. Z.; Mönig, H.; Schwendemann, T. C.; Ünverdi, Ö.; Altman, E. I.; Schwarz, U. D. (American Institute of Physics Inc., 2016)
      The extent to which point defects affect the local chemical reactivity and electronic properties of an oxide surface was evaluated with picometer resolution in all three spatial dimensions using simultaneous atomic ...
    • Understanding scanning tunneling microscopy contrast mechanisms on metal oxides: a case study 

      Mönig, H.; Todorović, M.; Baykara, M. Z.; Schwendemann, T. C.; Rodrigo, L.; Altman, E. I.; Pérez, R.; Schwarz, U. D. (American Chemical Society, 2013)
      A comprehensive analysis of contrast formation mechanisms in scanning tunneling microscopy (STM) experiments on a metal oxide surface is presented with the oxygen-induced (2√2×√2)R45 missing row reconstruction of the Cu(100) ...