Browsing by Author "Grimble, R. A."
Now showing items 1-4 of 4
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Direct measurement of interatomic force gradients using an ultra-low-amplitude atomic force microscope
(The Royal Society Publishing, 2001)Interatomic force gradients between a W tip and a 7 × 7 reconstructed Si(111) surface were measured using an off-resonance, ultra-low-amplitude atomic force microscope (AFM) technique. The amplitudes used were less than 1 ... -
High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy
(American Institute of Physics, 2003-06-23)We describe a new, highly sensitive noncontact atomic force microscope/scanning tunneling microscope (STM) operating in ultrahigh vacuum (UHV) with subangstrom oscillation amplitudes for atomic resolution imaging and ... -
Nanomechanics using an ultra-small amplitude AFM
(Cambridge University Press, 2001)A new type of AFM is presented which allows for direct measurements of nanomechanical properties in ultra-high vacuum and liquid environments. The AFM is also capable to atomic-scale imaging of force gradients. This is ... -
Quantitative atom-resolved force gradient imaging using non contact-AFM/STM
(American Institute of Physics, 2001)Quantitative force gradient images are obtained using a sub-angstrom amplitude, off-resonance lever oscillation method during scanning tunneling microscopy imaging. We report the direct observation of short-range bonds, ...
