Browsing by Author "Demirok, U. K."
Now showing items 1-7 of 7
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Charging/discharging of Au (core)/silica (shell) nanoparticles as revealed by XPS
(American Chemical Society, 2005)By recording XPS spectra while applying external voltage stress to the sample rod, we can control the extent of charging developed on core-shell-type gold nanoparticles deposited on a copper substrate, in both steady-state ... -
Electrical circuit modeling of surface structures for X-ray photoelectron spectroscopic measurements
(Elsevier BV * North-Holland, 2008)We model the X-ray photoelectron spectrometer and the sample with lumped electrical circuit elements, and simulate various types of conditions using a widely used computer program (PSpice) and compare the results with ... -
Enhanced peak separation in XPS with external biasing
(Elsevier, 2005-08-15)We have demonstrated that the An 4f peaks of the capped gold nanoparticles deposited on a SiO2 (20 nm)/Si substrate can be separated form the An 4f peaks of a gold metal strip, in contact with the same sample, by application ... -
Time-resolved XPS analysis of the SiO2/Si system in the millisecond range
(2004)By applying voltage pulses to the sample rod while recording the spectrum, we show, for the first time, that it is possible to obtain a time-resolved XPS spectrum in the millisecond range. The Si 2p spectrum of a silicon ... -
X-ray photoelectron spectroscopic analysis of Si nanoclusters in SiO 2 matrix
(American Chemical Society, 2006)We investigated silicon nanoclusters Si(nc) in a SiO2 matrix prepared by the plasma-enhanced chemical vapor deposition technique, using X-ray photoelectron spectroscopy (XPS) with external voltage stimuli in both static ... -
X-ray photoelectron spectroscopy for resistance-capacitance measurements of surface structures
(AIP Publishing, 2005-04-29)In x-ray photoemission measurements, differential charging causes the measured binding energy difference between the Si 2p of the oxide and the silicon substrate to vary nonlinearly as a function of the applied external ... -
XPS analysis with pulsed voltage stimuli
(2006)We record XPS spectra while applying 0 to +10 V or 0 to -10 V square pulses to the sample rod, which normally results in twinning of all peaks at correspondingly increased (for +10 V) or decreased (for -10 V) binding ...
