Now showing items 1-2 of 2

    • Atomic scale investigation of clean and epi-grown Si(001) surfaces using scanning tunneling microscopy 

      Özer, H. Özgür (Bilkent University, 1996)
      In this thesis, clean and epi-grown Si(001)(2x1)surfaces are analyzed by Scanning Tunneling Microscopy (STM). The STM and Ultra High Vacuum System (UHV) in which the microscope is installed, are described. A brief history ...
    • Nanomechanics using an ultra-small amplitude AFM 

      Hoffmann, P. M.; Jeffery, S.; Oral, Ahmet; Grimble, R. A.; Özer, H. Özgür; Pethica, J. B. (Cambridge University Press, 2001)
      A new type of AFM is presented which allows for direct measurements of nanomechanical properties in ultra-high vacuum and liquid environments. The AFM is also capable to atomic-scale imaging of force gradients. This is ...