Advisors

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Atomic scale investigation of clean and epi-grown Si(001) surfaces using scanning tunneling microscopy

Özer, H. Özgür (Bilkent University, 1996)

In this thesis, clean and epi-grown Si(001)(2x1)surfaces are analyzed by Scanning Tunneling Microscopy (STM). The STM and Ultra High Vacuum System (UHV) in which the microscope is installed, are described. A brief history ...
Fabrication, characterization, and extraction of GaAs mesfets

Ata, Erhan Polatkan (Bilkent University, 1994)

Metal Semiconductor Field Effect Transistor (MESFET) is the most widely used active element of today’s microwave industry. After development of the MESFET technology, the microwave industry gained a high acceleration, ...