Browsing by Keywords "Surfaces"
Now showing items 21-25 of 25
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Rapid classification of surface reflectance from image velocities
(Springer, Berlin, Heidelberg, 2009)We propose a method for rapidly classifying surface reflectance directly from the output of spatio-temporal filters applied to an image sequence of rotating objects. Using image data from only a single frame, we compute ... -
Scalar diffraction field calculation from curved surfaces via Gaussian beam decomposition
(Optical Society of America, 2012-06-29)We introduce a local signal decomposition method for the analysis of three-dimensional (3D) diffraction fields involving curved surfaces. We decompose a given field on a two-dimensional curved surface into a sum of properly ... -
Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes
(Elsevier Science B.V., 2002)Si(1 0 0)(2 × 1) surface is imaged using a new non-contact atomic force microscopy (nc-AFM)/STM with sub-Ångström oscillation amplitudes using stiff tungsten levers. Simultaneous force gradient and STM images of individual ... -
Target classification with simple infrared sensors using artificial neural networks
(IEEE, 2008-10)This study investigates the use of low-cost infrared (IR) sensors for the determination of geometry and surface properties of commonly encountered features or targets in indoor environments, such as planes, corners, edges, ... -
X-ray photoelectron spectroscopic characterization of Au collected with atom trapping on silica for atomic absorption spectrometry
(Sage Publications, Inc., 1997)The nature of analyte species collected on a cooled silica tube for atom-trapping atomic absorption spectrometric determination was investigated with the use of X-ray photoelctron spectroscopy (XPS). An XPS spectrum of ...
