Browsing by Author "Süzer, Şefik"
Now showing items 21-40 of 118
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Combined XPS and contact angle studies of ethylene vinyl acetate and polyvinyl acetate blends
(Elsevier, 2011-09-01)In this study, we prepared thin films by blending ethylene vinyl acetate copolymers (EVA) containing 12-33 (wt.%) vinyl acetate (VA) with polyvinyl acetate (PVAc) and high density polyethylene homopolymers. Large area ... -
Communication: Enhancement of dopant dependent x-ray photoelectron spectroscopy peak shifts of Si by surface photovoltage
(2011)Binding energies measured by x-ray photoelectron spectroscopy (XPS) are influenced by doping, since electrons are transferred to (p-type) and from (n-type) samples when they are introduced into the spectrometer, or brought ... -
Complexing agent effect on the stoichiometric ratio of the electrochemically prepared CuInSe2 thin films
(Elsevier, 2007)The electrodeposition of CuInSe2 is investigated to improve the stoichiometric properties of CuInSe2 layers on indium tin oxide (ITO)-coated glass substrates and to develop one-step electrodeposition method for solar cell ... -
The compressibility of high purity YbB2
(Institute of Physics Publishing Ltd., 2012)The compressibility and phase stability of Y bB 2 are investigated under high pressure using high-resolution synchrotron x-ray diffraction in a diamond anvil cell. The bulk modules of high purity Y bB 2 is obtained as ... -
DC electrowetting of nonaqueous liquid revisited by XPS
(American Chemical Society, 2018)Liquid poly(ethylene glycol) (molecular weight, ∼600 Da) with a low vapor pressure is used as droplets in an ultrahigh-vacuum X-ray photoelectron spectrometer (XPS) chamber with traditional electrowetting on dielectric ... -
Determination of electron affinity of phenyl radical by dissociative electron attachment technique
(John Wiley & Sons, 1993-03) -
Differential charging in SiO2/Si systems as determined by XPS
(American Chemical Society, 2004)The Si2p binding and the SiKLL kinetic energy difference between the SiO2 layer and Si substrate is shown to be influence by application of external voltage bias to the sample holder due to the differential charging as was ... -
Differential charging in x-ray photoelectron spectroscopy: a nuisance or a useful tool?
(American Chemical Society, 2003)We apply a negative bias to the sample while recording an XPS spectrum to enhance differential (positive) charging. The enhanced differential charging is due to the repulsion of stray electrons from the sample, which ... -
Differentiation of domains in composite surface structures by charge-contrast x-ray photoelectron spectroscopy
(2007)An external bias is applied to two samples containing composite surface structures, while recording an XPS spectrum. Altering the polarity of the bias affects the extent of differential charging in domains that are chemically ... -
Dynamic XPS measurements of ultrathin polyelectrolyte films containing antibacterial Ag–Cu nanoparticles
(American Vacuum Society, 2014)Ultrathin films consisting of polyelectrolyte layers prepared by layer-by-layer deposition technique and containing also Ag and Cu nanoparticles exhibit superior antibacterial activity toward Escherichia coli. These films ... -
Dynamical XPS measurements for probing photoinduced voltage changes
(2010)Photoillumination with 405 nm laser causes shifts in XPS peaks of n-Si(100), and CdS. To distinguish between surface photovoltage (SPV), and charging, dynamical measurements are performed, while sample is subjected to ... -
The effect of polar end of long-chain fluorocarbon oligomers in promoting the superamphiphobic property over multi-scale rough Al alloy surfaces
(Elsevier BV, 2016)Rough structures with re-entrant property and their subsequent surface energy reduction with long-chain fluorocarbon oligomers are both critical in developing superamphiphobic (SAP, i.e. both super hydrophobic and ... -
Effect of solvent refractive index on the surface plasmon resonance nanoparticle optical absorption
(2007)Optical properties of plasmon coupled silver and gold nanoparticles were studied as a function of the refractive index of the surrounding medium. Our studies confirmed that the effect of changes in the refractive index of ... -
Electrical and chemical characterization of chemically passivated silicon surfaces
(IEEE, 2008)The surface composition of chemically passivated silicon substrates is investigated using XPS and FTIR techniques. The samples are passivated with methanol, quinhydrone-methanol and iodine-methanol solution after HF ... -
Electrical circuit modeling of surface structures for X-ray photoelectron spectroscopic measurements
(Elsevier BV * North-Holland, 2008)We model the X-ray photoelectron spectrometer and the sample with lumped electrical circuit elements, and simulate various types of conditions using a widely used computer program (PSpice) and compare the results with ... -
Electrical properties from photoinduced charging on Cd-doped (100) surfaces of CuInSe2 epitaxial thin films
(AVS Science and Technology Society, 2016)The photoresponse of Cd-doped CuInSe2 (CIS) epitaxial thin films on GaAs(100) was studied using x-ray photoelectron spectroscopy under illumination from a 532 nm laser between sample temperatures of 28-260 °C. The initial, ... -
Electrochemical and XPS studies of corrosion behaviour of a low carbon steel in the presence of FT2000 inhibitor
(Elsevier Science Publishers B.V., 2001)Corrosion behaviour of a new inhibitor (FT2000) is investigated in saline solution on a low carbon steel in the neutral aqueous media at 60 °C. Effect of sulphate ion is also studied. Corrosion rate, polarization resistance, ... -
Electron spectroscopy for material characterization
(TÜBİTAK, 1998)Basic principles of the two electron spectroscopic techniques, the x-ray photoelectron spectroscopy, XPS, and the Auger electron spectroscopy, AES, are given. Their utilization in material characterization are introduced ... -
Enhanced peak separation in XPS with external biasing
(Elsevier, 2005-08-15)We have demonstrated that the An 4f peaks of the capped gold nanoparticles deposited on a SiO2 (20 nm)/Si substrate can be separated form the An 4f peaks of a gold metal strip, in contact with the same sample, by application ...
