Baykara, Mehmet Z.Schwarz, U. D.Lindon, J.Tranter, G. E.Koppenaal, D.2019-04-232019-04-2320179780128032244http://hdl.handle.net/11693/50898This chapter provides an overview of atomic force microscopy, covering the fundamental aspects of the associated instrumentation and methodology as well as representative results from the literature highlighting a variety of application areas. In particular, atomic-resolution imaging and spectroscopy capabilities are emphasized, in addition to applications in biology, nanotribology and catalysis research. Finally, an outlook on emerging aspects and future prospects of atomic force microscopy is provided.EnglishAdhesionAtomic force microscopyBiomaterialsCatalysisElasticityForce spectroscopyFrictionKelvin probe force microscopyMetalsMetal oxidesNanomechanicsNanotribologyScanning probe microscopyScanning tunneling microscopySemiconductorsBook Chapter10.1016/B978-0-12-409547-2.12141-9