Süzer, Ş.Voscoboinikov, T.Hallam, K. R.Allen, G. C.2016-02-082016-02-0819960937-0633http://hdl.handle.net/11693/25733Float glasses of different thicknesses and a conducting tin oxide glass have been investigated using Photo and Auger Electron Spectroscopy induced by AlKα X-rays. On the basis of measured chemical XPS shifts in the binding energies the chemical state of Sn (+2 or +4) incorporated on the float glasses could not be assigned. The use of the Auger parameter allows to separate relaxation and chemical contributions. The derived true chemical shifts of Sn on float-glasses are larger than those of SnO and/or SnO2 due to the larger ionic environment of the glass matrix. Ar+ or HF etching reveals that the concentration of Sn decreases exponentially as a function of depth from the surface. © Springer-Verlag 1996.EnglishAuger electron spectroscopyCoatingsMetalsTinChemical shiftCoordination numberFloat glassPhotoelectron emissionThin filmsArticle10.1007/s0021663550654