Dede, MünirÜrkmen, KorayOral, AhmetFarrer, I.Ritchie, D. A.2016-02-082016-02-082006http://hdl.handle.net/11693/27156Date of Conference: 8-12 May 2006Conference Name: IEEE International Magnetics Conference, INTERMAG 2006Scanning Hall Probe Microscopy (SHPM) is a quantitative and non-invasive technique for imaging localized surface magnetic field fluctuations such as ferromagnetic domains. In this work, we have eliminated the difficulty in the cantilever-Hall probe integration process, just by gluing a Hall Probe chip to a quartz crystal tuning fork force sensor. The resultant SHPM can operate in variable temperature environment, 77-300 K.EnglishTemperatureHall effect devicesAtomic force microscopyMagnetic force microscopyMagnetic fieldsVariable temperature Scanning Hall Probe Microscopy (SHPM) using quartz crystal AFM feedbackConference Paper10.1109/INTMAG.2006.376308