Özbay, EkmelTemelkuran, BurakSigalas, M.Tuttle, G.Soukoulis, C. M.Ho, K. M.2016-02-082016-02-081998-05http://hdl.handle.net/11693/27681Date of Conference: 3–8 May 1998Conference name: Summaries of Papers Presented at the International Quantum Electronics Conference, 1998The reflection properties of layer-by-layer metallic photonic crystals were investigated using metallic photonic crystals with simple-tetragonal (st) structure. The observed properties were used to predict defect formation in these crystals. The reflection and transmission amplitude characteristics were measured by a network analyzer and standard gain horn antennas. Transformation matrix method was employed for the theoretical simulations.EnglishCrystal defectsLight polarizationLight reflectionLight transmissionMatrix algebraMetallic superlatticesPhotonic crystalsTransformation matrix methodOptical materialsConference Paper10.1109/IQEC.1998.680164