Arslan, E.Çakmakyapan S.Kazar, Ö.Bütün, S.Lişesivdin, S. B.Cinel, N. A.Ertaş, G.Ardalı, Ş.Tıraş, E.Jawad-ul-Hassan,Özbay, EkmelJanzén, E.2016-02-082016-02-0820141738-8090http://hdl.handle.net/11693/26638Hall effect measurements on epitaxial graphene (EG) on SiC substrate have been carried out as a function of temperature. The mobility and concentration of electrons within the two-dimensional electron gas (2DEG) at the EG layers and within the underlying SiC substrate are readily separated and characterized by the simple parallel conduction extraction method (SPCEM). Two electron carriers are identified in the EG/SiC sample: one highmobility carrier (3493 cm2 /Vs at 300 K) and one low-mobility carrier (1115 cm2 /Vs at 300 K). The high mobility carrier can be assigned to the graphene layers. The second carrier has been assigned to the SiC substrate.EnglishGrapheneParallel conductionRaman spectroscopyHall measurementsArticle10.1007/s13391-013-3159-2