Brook, J.Bending, S. J.Pinto, J.Oral, A.Ritchie, D.Beere, H.Henini, M.Springthorpe, A.2015-07-282015-07-2820030003-6951http://hdl.handle.net/11693/11282We report the development of an advanced sensor for atomic force-guided scanning Hall probe microscopy whereby both a high mobility heterostructure Hall effect magnetic sensor and an n-Al0.4Ga0.6As piezoresistive displacement sensor have been integrated in a single III-V semiconductor cantilever. This allows simple operation in high-vacuum/variable-temperature environments and enables very high magnetic and topographic resolution to be achieved simultaneously. Scans of magnetic induction and topography of a number of samples are presented to illustrate the sensor performance at 300 and 77 K. (C) 2003 American Institute of Physics.EnglishGaasArticle10.1063/1.1576914