Özer, H. Ö.Atabak, M.Oral, A.2015-07-282015-07-282002-120038-1098http://hdl.handle.net/11693/11206Si(100)(2 x 1) surface is imaged using a new nc-AFM (non-contact atomic force microscopy)/STM with sub-Angstrom oscillation amplitudes using stiff hand-made tungsten levers. Simultaneous force gradient and scanning tunneling microscopy images of individual dimers and atomic scale defects are obtained. We measured force-distance and dissipation-distance curves with different tips. Some of the tips show long-range force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction give atomic resolution in force gradient scans. This result suggests that short-range force interactions are responsible for atomic resolution in nc-AFM. We also observed an increase in the dissipation as the tip is approached closer to the surface, followed by an unexpected decrease as we pass the inflection point in the energy-distance curve. (C) 2002 Elsevier Science Ltd. All rights reserved.EnglishSi (100) SurfaceNc-afm/stm StudiesArticle10.1016/S0038-1098(02)00547-1