Özer, H. Ö.Atabak, M.Ellialtoğlu, R. M.Oral, A.2016-02-082016-02-0820020169-4332http://hdl.handle.net/11693/27576Si(1 0 0)(2 × 1) surface is imaged using a new non-contact atomic force microscopy (nc-AFM)/STM with sub-Ångström oscillation amplitudes using stiff tungsten levers. Simultaneous force gradient and STM images of individual dimers and atomic scale defects are obtained. We measured force-distance (f-d) curves with different tips. Some of the tips show long force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction give atomic resolution in force gradient scans. This result suggests that short-range force interactions are responsible for atomic resolution in nc-AFM.EnglishForce-distance spectroscopyNon-contact atomic force microscopyShort-range forcesSi(1 0 0)(2 × 1)Small oscillation amplitudesAtomic force microscopyImaging techniquesOscillationsScanning tunneling microscopySurfacesOscillation amplitudesSemiconducting siliconSimultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudesArticle10.1016/S0169-4332(01)00942-4