Sezen, H.Süzer, Şefik2015-07-282015-07-282013-05-010040-6090http://hdl.handle.net/11693/10854By recording X-ray photoelectron spectroscopic binding energy shifts, while subjecting samples to a variety of optical and electrical stimuli, information about charge accumulation on materials or surface structures can be obtained. These stimuli included d.c. as well as a.c. electrical and/or optical pulses covering a wide frequency range (10−3 to 106 Hz) for probing charging and/or photovoltage shifts, stemming from impurities, dopants, defects, etc., whether created intentionally or not. The methodology is simple to implement and provides several new dimensions for thin films and materials analyses.EnglishArticle10.1016/j.tsf.2013.02.0021879-2731