Chhabra, B.Süzer, ŞefikOpila, R. L.Honsberg, C. B.2016-02-082016-02-0820080160-8371http://hdl.handle.net/11693/26807Date of Conference: 11-16 May 2008Conference Name: 33rd IEEE Photovoltaic Specialists Conference, IEEE 2008The surface composition of chemically passivated silicon substrates is investigated using XPS and FTIR techniques. The samples are passivated with methanol, quinhydrone-methanol and iodine-methanol solution after HF treatment. The minority carrier lifetimes of these chemically passivated silicon substrates are also measured. Quinhydrone-methanol solution provides a chemically inert surface and a considerably longer minority carrier lifetime.EnglishChemical characterizationFtir techniquesHF treatmentInert surfacesMinority carrier lifetimesSilicon substratesSilicon surfacesMethanolPassivationConference Paper10.1109/PVSC.2008.4922673