Süzer, ŞefikSezen, H.Dâna, A.2016-02-082016-02-0820080003-2700http://hdl.handle.net/11693/23120We describe a method for obtaining two-dimensional X-ray photoelectron spectroscopic data derived from the frequency dependence of the XPS peaks recorded under electrical square-wave pulses, which control and affect the binding energy positions via the electrical potentials developed as a result of charging. By using cross-correlations between various peaks, our technique enables us to elucidate electrical characteristics of surface structures of composite samples and bring out various correlations between hidden/overlapping peaks. © 2008 American Chemical Society.EnglishBinding energyComposite materialsCorrelation methodsElectric potentialTwo dimensionalX ray photoelectron spectroscopyBinding energy positionsComposite surfacesFrequency dependenceSurface structureArticle10.1021/ac702642w