Balantekin, M.Atalar, Abdullah2015-07-282015-07-2820050003-6951http://hdl.handle.net/11693/11411Higher-harmonics generation in a tapping-mode atomic force microscope is a consequence of the nonlinear tip-sample interaction force. The higher harmonics contain important information about the materials’ nanomechanical properties. These harmonics can be significantly enhanced by driving the cantilever close to a submultiple of its resonant frequency. We present the results of enhanced higher-harmonic imaging experiments on several samples. The results indicate that enhanced higher harmonics can be utilized effectively for both material characterization and surface roughness analysis with a high signal-to-noise ratio. © 2005 American Institute of PhysicsEnglishGenerationCantileverAtomic Force MicroscopyImaging TechniquesNanostructured MaterialsSignal To Noise RatioSurface RoughnessNanomechanical PropertiesHarmonic AnalysisArticle10.1063/1.2147708