Adams, J. D.Minne, S. C.Manalis, S. R.Wilder, K.Yaralioglu, G.Atalar, AbdullahAdderton, D.Quate, C. F.2019-03-272019-03-271998http://hdl.handle.net/11693/50746EnglishHigh throughput, high resolution scanning probe microscopyArticle