Butun, B.Bıyıklı, NecmiKimukin, I.Aytur, O.Özbay, EkmelPostigo, P. A.Silveira, J. P.Alija, A. R.2016-02-082016-02-0820040003-6951http://hdl.handle.net/11693/24284The 1.55 μm high-speed operation of GaAs-based p-i-n photodiodes was demonstrated and their design, growth and fabrication were discussed. A resonant-cavity-detector structure was used to selectively enhance the photoresponse at 1.55 μm. The bottom mirror of the resonant cavity was formed by a highly reflecting 15-pair GaAs/AlAs Bragg mirror and molecular-beam epitaxy was used for wafer growth. It was found that the fabricated devices exhibited a resonance of around 1548 nm and an enhancement factor of 7.5 was achieved when compared to the efficiency of a single-pass detector.EnglishBandwidthCavity resonatorsLight absorptionMirrorsMolecular beam epitaxyOptical fibersPhotocurrentsPhotodetectorsReflection high energy electron diffractionResonanceSemiconducting aluminum compoundsSemiconducting gallium arsenideDetector cavitiesOptical designsPulse-response measurementsResonant-cavity-detector structuresPhotodiodesArticle10.1063/1.1756208