Sayan, Ş.Süzer, S.Uner, D. O.2015-07-282015-07-281997-06-160022-2860http://hdl.handle.net/11693/10875Ru(NO)(N0&/Si02 catalyst precursors were characterized via XPS and in-situ reflectance IR spectroscopy before, during and after reduction by hydrogen over the temperature range 300-800 K. IR results indicated that the catalyst precursor lost NO3 groups first, with subsequent loss of NO both in a reducing atmosphere and during thermal annealing. XPS was used to derive information on the oxidation state of Ru in the various steps of the annealing and/or reduction processes. 0 1997 Elsevier Science B.V.EnglishRu catalystXPSIn-situ IRXPS and in-situ IR investigation of Ru/SiO2 catalystArticle10.1016/S0022-2860(96)09637-8