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dc.contributor.authorGürler, Ülküen_US
dc.contributor.editorKotz, S.en_US
dc.contributor.editorRead, C. B.en_US
dc.contributor.editorBalakrishnan, N.en_US
dc.contributor.editorVidakovic, B.en_US
dc.contributor.editorJohnson, N. L.en_US
dc.date.accessioned2019-05-21T06:23:57Z
dc.date.available2019-05-21T06:23:57Z
dc.date.issued2006en_US
dc.identifier.isbn9780471150442
dc.identifier.urihttp://hdl.handle.net/11693/51440
dc.language.isoEnglishen_US
dc.relation.ispartofEncyclopedia of statistical sciences: Toeplitz lemma to VN-Testen_US
dc.relation.isversionofhttps://doi.org/10.1002/0471667196en_US
dc.titleTwo-sample matching testen_US
dc.typeBook Chapteren_US
dc.departmentDepartment of Industrial Engineeringen_US
dc.citation.spage8796en_US
dc.citation.epage8798en_US
dc.citation.volumeNumber13en_US
dc.identifier.doi10.1002/0471667196en_US
dc.publisherJohn Wiley & Sonsen_US
dc.identifier.eisbn9780471667193


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