Phase imaging in reflection with the acoustic microscope
Date
1978-01
Editor(s)
Advisor
Supervisor
Co-Advisor
Co-Supervisor
Instructor
Source Title
Applied Physics Letters
Print ISSN
0003-6951
Electronic ISSN
1077-3118
Publisher
A I P Publishing
Volume
31
Issue
12
Pages
791 - 793
Language
English
Type
Journal Title
Journal ISSN
Volume Title
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Abstract
When a polished surface of a single crystal is examined with a converging acoustic beam the reflected signal has a characteristic response that is dependent upon the elastic properties of the reflecting surface. This property can be used in the acoustic microscope to monitor the thickness of layers deposited on these surfaces and the smallāscale variations of the elastic parameters in these materials.