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dc.contributor.authorJavili, A.en_US
dc.contributor.authorOttosen, N. S.en_US
dc.contributor.authorRistinmaa, M.en_US
dc.contributor.authorMosler, J.en_US
dc.date.accessioned2019-02-11T13:12:47Z
dc.date.available2019-02-11T13:12:47Z
dc.date.issued2018en_US
dc.identifier.issn1081-2865
dc.identifier.urihttp://hdl.handle.net/11693/49260
dc.description.abstractInterfaces significantly influence the overall material response especially when the area-to-volume ratio is large, for instance in nanocrystalline solids. A well-established and frequently applied framework suitable for modeling interfaces dates back to the pioneering work by Gurtin and Murdoch on surface elasticity theory and its generalization to interface elasticity theory. In this contribution, interface elasticity theory is revisited and different aspects of this theory are carefully examined. Two alternative formulations based on stress vectors and stress tensors are given to unify various existing approaches in this context. Focus is on the hyper-elastic mechanical behavior of such interfaces. Interface elasticity theory at finite deformation is critically reanalyzed and several subtle conclusions are highlighted. Finally, a consistent linearized interface elasticity theory is established. We propose an energetically consistent interface linear elasticity theory together with its appropriate stress measures.en_US
dc.language.isoEnglishen_US
dc.source.titleMathematics and Mechanics of Solidsen_US
dc.relation.isversionofhttps://doi.org/10.1177/1081286517699041en_US
dc.subjectCoherent interfacesen_US
dc.subjectGurtin–Murdoch theoryen_US
dc.subjectInterface elasticityen_US
dc.subjectLinearized elasticityen_US
dc.subjectSurface shearen_US
dc.titleAspects of interface elasticity theoryen_US
dc.typeArticleen_US
dc.departmentDepartment of Mechanical Engineeringen_US
dc.citation.spage1004en_US
dc.citation.epage1024en_US
dc.citation.volumeNumber23en_US
dc.citation.issueNumber7en_US
dc.identifier.doi10.1177/1081286517699041en_US
dc.publisherSage Publications Ltd.en_US
dc.identifier.eissn1741-3028


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