Browsing Advanced Research Laboratories (ARL) by Author "Brettschneider, T."

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    • Influence of noise on force measurements 

      Volpe, Giovanni; Helden, L.; Brettschneider, T.; Wehr, J.; Bechinger, C. (The American Physical Society, 2010-04)
      We demonstrate how the ineluctable presence of thermal noise alters the measurement of forces acting on microscopic and nanoscopic objects. We quantify this effect exemplarily for a Brownian particle near a wall subjected ...

    • Novel perspectives for the application of total internal reflection microscopy 

      Volpe, Giovanni; Brettschneider, T.; Helden, L.; Bechinger, C. (Optical Society of America, 2009-12)
      Total Internal Reflection Microscopy (TIRM) is a sensitive non-invasive technique to measure the interaction potentials between a colloidal particle and a wall with femtonewton resolution. The equilibrium distribution of ...