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dc.contributor.authorAghdam, Sina Rezaeien_US
dc.contributor.authorDuman, Tolga M.en_US
dc.coverage.spatialBarcelona, Spainen_US
dc.date.accessioned2018-04-12T11:49:01Z
dc.date.available2018-04-12T11:49:01Z
dc.date.issued2016en_US
dc.identifier.issn2157-8095en_US
dc.identifier.urihttp://hdl.handle.net/11693/37720
dc.descriptionDate of Conference: 10-15 July 2016en_US
dc.descriptionConference Name: IEEE International Symposium on Information Theory, ISIT 2016en_US
dc.description.abstractWe propose a low complexity transmit signal design scheme for achieving information-theoretic secrecy over a MIMO wiretap channel driven by finite-alphabet inputs. We assume that the transmitter has perfect channel state information (CSI) of the main channel and also knows the statistics of the eavesdropper's channel. The proposed transmission scheme relies on jointly optimizing the precoder matrix and the artificial noise so as to maximize the achievable secrecy rates. In order to lower the computational complexity associated with the transmit signal design, we employ a design metric using the cut-off rate instead of the mutual information. We formulate a gradient-descent based optimization algorithm and demonstrate via extensive numerical examples that the proposed signal design scheme can yield an enhanced secrecy performance compared with the existing solutions in spite of its relatively lower computational complexity. The impacts of the modulation order as well as the number of antennas at the transmitter and receiver ends on the achievable secrecy rates are also investigated.en_US
dc.language.isoEnglishen_US
dc.source.titleProceedings of the IEEE International Symposium on Information Theory, ISIT 2016en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/ISIT.2016.7541847en_US
dc.subjectCut-off rateen_US
dc.subjectFinite-alphabet inputsen_US
dc.subjectMIMO wiretap channelen_US
dc.subjectPhysical layer securityen_US
dc.subjectPrecodingen_US
dc.titleLow complexity precoding for MIMOME wiretap channels based on cut-off rateen_US
dc.typeConference Paperen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spage2988en_US
dc.citation.epage2992en_US
dc.identifier.doi10.1109/ISIT.2016.7541847en_US
dc.publisherIEEEen_US


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