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dc.contributor.authorAlp, Y. K.en_US
dc.contributor.authorKorucu, A. B.en_US
dc.contributor.authorKarabacak, A. T.en_US
dc.contributor.authorGürbüz, A. C.en_US
dc.contributor.authorArıkan, Orhanen_US
dc.coverage.spatialZonguldak, Turkeyen_US
dc.date.accessioned2018-04-12T11:48:40Z
dc.date.available2018-04-12T11:48:40Z
dc.date.issued2016en_US
dc.identifier.urihttp://hdl.handle.net/11693/37708
dc.descriptionDate of Conference: 16-19 May 2016en_US
dc.descriptionConference Name: IEEE 24th Signal Processing and Communications Applications Conference, SIU 2016en_US
dc.description.abstractIn this work, we propose a new method for online calibration of recently proposed Modulated Wideband Converter (MWC), which digitizes wideband sparse signals below the Nyquist limit without loss of information by using compressive sensing techniques. Our method requires a single frequency synthesizer card, which can generate clean tones along the operation band of the system, rather than much expensive measurement instruments such as network analyser or vector spectrum analyser, which are not appropriate for online calibration. Moreover, low computational complexity of the proposed method enables its implementation on FPGA so that it can be embedded into the system. Hence, on each power on, the system can utilize self calibration without requiring any additional measurement instruments.en_US
dc.language.isoTurkishen_US
dc.source.titleProceedings of the IEEE 24th Signal Processing and Communications Applications Conference, SIU 2016en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/SIU.2016.7495889en_US
dc.subjectCompressive sensingen_US
dc.subjectMVCen_US
dc.subjectOnline calibrationen_US
dc.subjectSparseen_US
dc.subjectSub-Nyquist samplingen_US
dc.titleOnline calibration of modulated wideband converteren_US
dc.title.alternativeKiplemeli geniş bant çeviricinin sahada kalibrasyonuen_US
dc.typeConference Paperen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spage913en_US
dc.citation.epage916en_US
dc.identifier.doi10.1109/SIU.2016.7495889en_US
dc.publisherIEEEen_US


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