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dc.contributor.authorTeke, Oğuzhanen_US
dc.contributor.authorGürbüz, A.C.en_US
dc.contributor.authorArıkan, Orhanen_US
dc.coverage.spatialMugla, Turkeyen_US
dc.date.accessioned2016-02-08T12:13:49Z
dc.date.available2016-02-08T12:13:49Z
dc.date.issued2012en_US
dc.identifier.urihttp://hdl.handle.net/11693/28196
dc.descriptionDate of Conference: 18-20 April 2012en_US
dc.description.abstractCompressive Sensing (CS) theory details how a sparsely represented signal in a known basis can be reconstructed using less number of measurements. However in reality there is a mismatch between the assumed and the actual bases due to several reasons like discritization of the parameter space or model errors. Due to this mismatch, a sparse signal in the actual basis is definitely not sparse in the assumed basis and current sparse reconstruction algorithms suffer performance degradation. This paper presents a novel orthogonal matching pursuit algorithm that has a controlled perturbation mechanism on the basis vectors, decreasing the residual norm at each iteration. Superior performance of the proposed technique is shown in detailed simulations. © 2012 IEEE.en_US
dc.language.isoTurkishen_US
dc.source.title2012 20th Signal Processing and Communications Applications Conference (SIU)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/SIU.2012.6204606en_US
dc.subjectBasis vectoren_US
dc.subjectCompressive sensingen_US
dc.subjectControlled perturbationen_US
dc.subjectModel errorsen_US
dc.subjectOrthogonal matching pursuiten_US
dc.subjectParameter spacesen_US
dc.subjectPerformance degradationen_US
dc.subjectResidual normen_US
dc.subjectSparse reconstructionen_US
dc.subjectSparse recoveryen_US
dc.subjectSparse signalsen_US
dc.subjectChannel estimationen_US
dc.subjectDegradationen_US
dc.subjectSignal processingen_US
dc.titleA new OMP technique for sparse recoveryen_US
dc.title.alternativeSeyrek geriçatma için yeni bir OMP yöntemien_US
dc.typeConference Paperen_US
dc.departmentDepartment of Electrical and Electronics Engineering
dc.identifier.doi10.1109/SIU.2012.6204606en_US
dc.publisherIEEEen_US


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