Optimum power randomization for the minimization of outage probability
Vanli, N. D.
Varshney P. K.
IEEE Transactions on Wireless Communications
4627 - 4637
Item Usage Stats
MetadataShow full item record
The optimum power randomization problem is studied to minimize outage probability in flat block-fading Gaussian channels under an average transmit power constraint and in the presence of channel distribution information at the transmitter. When the probability density function of the channel power gain is continuously differentiable with a finite second moment, it is shown that the outage probability curve is a nonincreasing function of the normalized transmit power with at least one inflection point and the total number of inflection points is odd. Based on this result, it is proved that the optimum power transmission strategy involves randomization between at most two power levels. In the case of a single inflection point, the optimum strategy simplifies to on-off signaling for weak transmitters. Through analytical and numerical discussions, it is shown that the proposed framework can be adapted to a wide variety of scenarios including log-normal shadowing, diversity combining over Rayleigh fading channels, Nakagami-m fading, spectrum sharing, and jamming applications. We also show that power randomization does not necessarily improve the outage performance when the finite second moment assumption is violated by the power distribution of the fading. © 2013 IEEE.
Channel distribution information at the transmitters
Probability density function
Wireless telecommunication systems
Published Version (Please cite this version)http://dx.doi.org/10.1109/TWC.2013.072513.121945
Showing items related by title, author, creator and subject.
Klyachko, A. A.; Özen, I. (2009)The results of our study are twofold. From the random matrix theory point of view we obtain results on the rank distribution of column submatrices. We give the moments and the covariances between the ranks (q- rank) of ...
Sezgin, F. (World Scientific Publishing Co. Pte. Ltd., 2009)The Geometric Random Inner Product (GRIP) is a recently developed test method for randomness. As a relatively new method, its properties, weaknesses, and strengths are not well documented. In this paper, we provide a ...
Alouani, I.; Ahangari, Hamzeh; Öztürk, Özcan; Niar, S. (IEEE, 2016-08-09)Technology shift and voltage scaling increased the susceptibility of Static Random Access Memories (SRAMs) to errors dramatically. In this paper, we present NS-SRAM, for Neighborhood Solidarity SRAM, a new technique to ...