XPS and IR characterization of manganese ions deposited on alumina
Journal of Molecular Structure
Please cite this item using this persistent URLhttp://hdl.handle.net/11693/27850
By application of XPS and FTIR spectroscopy of adsorbed CO the effect of preparation conditions on the state and localization of manganese ions deposited on η-Al2O3 is studied. Both Mn2+ and Mn3+ ions are observed on the impregnated sample. The sample obtained by ion exchange contains only Mn3+ ions. The adsorbed CO species are identified.
- Conference Paper