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dc.contributor.authorBozkurt, A.en_US
dc.contributor.authorArikan, O.en_US
dc.contributor.authorAtalar, Abdullahen_US
dc.date.accessioned2016-02-08T12:01:06Z
dc.date.available2016-02-08T12:01:06Z
dc.date.issued1995en_US
dc.identifier.isbn0-7803-2940-6
dc.identifier.issn1051-0117
dc.identifier.urihttp://hdl.handle.net/11693/27759
dc.description.abstractA synthetic aperture acoustic imaging system with a novel inversion algorithm is described. Data is obtained by using a transducer insonifying the sample surface at a critical angle which is excited by a short electrical pulse. The critical angle is chosen for a suitable surface wave or Lamb wave mode that exists on the object. The transducer is mechanically scanned in only one direction during which many pulse excitations and subsequent recordings are realized. The received signal is sampled in time and digitized to be processed by using the new inversion approach providing an optimal 2-D image of the surface reflectivity.en_US
dc.language.isoEnglishen_US
dc.source.titleProceedings of the IEEE Ultrasonics Symposiumen_US
dc.relation.isversionofhttps://doi.org/10.1109/ULTSYM.1995.495682en_US
dc.subjectAcoustic transducersen_US
dc.subjectAcoustic wave reflectionen_US
dc.subjectAlgorithmsen_US
dc.subjectComputational geometryen_US
dc.subjectComputer simulationen_US
dc.subjectData acquisitionen_US
dc.subjectData recordingen_US
dc.subjectDigital signal processingen_US
dc.subjectElectric excitationen_US
dc.subjectImaging systemsen_US
dc.subjectSurface wavesen_US
dc.subjectSynthetic aperture radaren_US
dc.subjectCritical angleen_US
dc.subjectElectrical pulse excitationen_US
dc.subjectInsonifyingen_US
dc.subjectInversion algorithmen_US
dc.subjectLamb waveen_US
dc.subjectSingular value decompositionen_US
dc.subjectSurface reflectivityen_US
dc.subjectSynthetic aperture acoustic imaging systemen_US
dc.subjectAcoustic imagingen_US
dc.titleSynthetic aperture imaging system using surface wave modesen_US
dc.typeConference Paperen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spage779en_US
dc.citation.epage782en_US
dc.citation.volumeNumber1en_US
dc.identifier.doi10.1109/ULTSYM.1995.495682en_US
dc.publisherIEEEen_US


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