XPS and in-situ IR investigation of Ru/SiO2 catalyst
Please cite this item using this persistent URLhttp://hdl.handle.net/11693/27719
Journal of Molecular Structure
- Conference Paper 
Ru(NO)(NO3)3/SiO2 catalyst precursors were characterized via XPS and in-situ reflectance IR spectroscopy before, during and after reduction by hydrogen over the temperature range 300-800 K. IR results indicated that the catalyst precursor lost NO3 groups first, with subsequent loss of NO both in a reducing atmosphere and during thermal annealing. XPS was used to derive information on the oxidation state of Ru in the various steps of the annealing and/or reduction processes.