Reflection properties and defect formation in metallic photonic crystals

Date
1998-05
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Source Title
Technical Digest - Summaries of Papers Presented at the International Quantum Electronics Conference - Conference Edition, 1998
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Publisher
IEEE
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Pages
81 - 82
Language
English
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Abstract

The reflection properties of layer-by-layer metallic photonic crystals were investigated using metallic photonic crystals with simple-tetragonal (st) structure. The observed properties were used to predict defect formation in these crystals. The reflection and transmission amplitude characteristics were measured by a network analyzer and standard gain horn antennas. Transformation matrix method was employed for the theoretical simulations.

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