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dc.contributor.authorFardmanesh, M.en_US
dc.contributor.authorRothwarf, A.en_US
dc.date.accessioned2016-02-08T11:58:51Z
dc.date.available2016-02-08T11:58:51Z
dc.date.issued1998en_US
dc.identifier.issn0277-786Xen_US
dc.identifier.urihttp://hdl.handle.net/11693/27657
dc.description.abstractSuperconducting film and substrate interface effects on the response of superconductive edge-transition bolometers are modeled with a one dimensional thermal model in closed form, for samples with large area patterns compared to the substrate thickness. The results from the model agree with experimental results on samples made of meander line patterned granular YBCO films on crystalline substrates, in both the magnitude and phase of the response versus modulation frequency up to about 100 KHz, the limit of the characterization setup. Using the fit of the calculated frequency response curves obtained from the model to the measured ones, values of the film-substrate and substrate-holder thermal boundary resistance, heat capacity of the superconducting film, and the thermal parameters of the substrate materials could be investigated. While the calculated magnitude and phase of the response of the SrTiO3 substrate samples obtained from the model is in a very good agreement with the measured values, the calculated response of the LaAlO3 and MgO substrate samples deviate slightly from the measured values at very low frequencies, increasing with an increase in the thermal conductivity of the substrate material. Using the fit of the calculated response to the measured values, film-substrate thermal boundary resistances in the range of 4.4* 10-3 to 4.4* 10-2 K-cm2-w-1 are obtained for different substrate materials. The effect of substrate optical absorption in the response of the samples is also investigated.en_US
dc.language.isoEnglishen_US
dc.source.titleProceedings of SPIE - The International Society for Optical Engineeringen_US
dc.subjectBolometersen_US
dc.subjectCrystalline materialsen_US
dc.subjectFrequency modulationen_US
dc.subjectInterfaces (materials)en_US
dc.subjectLanthanum compoundsen_US
dc.subjectMathematical modelsen_US
dc.subjectOxide superconductorsen_US
dc.subjectStrontium compoundsen_US
dc.subjectSubstratesen_US
dc.subjectSuperconducting filmsen_US
dc.subjectThermal conductivity of solidsen_US
dc.subjectYttrium barium copper oxidesen_US
dc.subjectSuperconductive edge-transition bolometersen_US
dc.subjectThermal boundary resistanceen_US
dc.subjectSuperconducting devicesen_US
dc.titleAnalytic modeling of patterned high-Tc superconductive bolometers: film and substrate interface effectsen_US
dc.typeConference Paperen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spage469en_US
dc.citation.epage479en_US
dc.citation.volumeNumber3481en_US
dc.publisherSPIE, Bellingham, WA, United Statesen_US


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