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dc.contributor.authorTerzi, M.B.en_US
dc.contributor.authorArikan, O.en_US
dc.contributor.authorAbaci, A.en_US
dc.contributor.authorCandemir, M.en_US
dc.contributor.authorDedoʇlu, M.en_US
dc.date.accessioned2016-02-08T11:56:06Z
dc.date.available2016-02-08T11:56:06Z
dc.date.issued2014en_US
dc.identifier.urihttp://hdl.handle.net/11693/27543
dc.description.abstractIn patients with acute coronary syndrome, temporary chest pains together with changes in ECG ST segment and T wave occur shortly before the start of myocardial infarction. In order to diagnose acute coronary syndromes early, a new technique which detects changes in ECG ST/T sections is developed. As a result of implementing the developed technique to real ECG recordings, it is shown that the proposed technique provides reliable detections. Therefore, the developed technique is expected to provide early diagnosis of acute coronary syndromes which will lead to a significant decrease in heart failure and mortality rates. © 2014 IEEE.en_US
dc.language.isoTurkishen_US
dc.source.title2014 18th National Biomedical Engineering Meeting, BIYOMUT 2014en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/BIYOMUT.2014.7026388en_US
dc.subjectacute coronary syndromeen_US
dc.subjectacute myocardial infarctionen_US
dc.subjectElectrocardiogram (ECG) signal classificationen_US
dc.subjectfeature detectionen_US
dc.subjectkernel methoden_US
dc.subjectsupport vector machine (SVM)en_US
dc.subjectBiomedical engineeringen_US
dc.subjectCardiologyen_US
dc.subjectDiseasesen_US
dc.subjectElectrocardiographyen_US
dc.subjectHearten_US
dc.subjectSupport vector machinesen_US
dc.subjectAcute coronary syndromesen_US
dc.subjectAcute myocardial infarctionen_US
dc.subjectElectrocardiogram signal classificationsen_US
dc.subjectFeature detectionen_US
dc.subjectKernel methodsen_US
dc.subjectDiagnosisen_US
dc.titleEarly diagnosis of acute coronary syndromes with automatic ST/T classifieren_US
dc.title.alternativeAkut koroner sendromlarin otomatik ST/T siniflandiricisi ile erken tanisien_US
dc.typeConference Paperen_US
dc.departmentDepartment of Electrical and Electronics Engineering
dc.identifier.doi10.1109/BIYOMUT.2014.7026388en_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US


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