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dc.contributor.authorBozbey, A.en_US
dc.contributor.authorFardmanesh, M.en_US
dc.contributor.authorAskerzade I.N.en_US
dc.contributor.authorBanzet, M.en_US
dc.contributor.authorSchubert J.en_US
dc.date.accessioned2016-02-08T11:54:42Z
dc.date.available2016-02-08T11:54:42Z
dc.date.issued2003en_US
dc.identifier.issn0953-2048
dc.identifier.urihttp://hdl.handle.net/11693/27486
dc.description.abstractDependence of the phase and magnitude of the response of Y-Ba-Cu-O edge transition bolometers on the superconducting transition is studied. The responses of both large and small area devices were investigated and several anomalies are observed. The response of small area LaAlO3 devices considerably differed from that expected based on the dR/dT curve. This discrepancy is observed to be strongly dependent on the superconducting transition. Both the phase and magnitude/(dR/dT) of the response of the devices showed abrupt changes for below the Tc-onset when measured versus temperature, while the phase variation also showed strong dependence on the modulation frequency. We present the analysis and propose mechanisms responsible for the modulation frequency dependence of the response characteristics versus temperature, within the superconductivity transition region of the devices.en_US
dc.language.isoEnglishen_US
dc.source.titleSuperconductor Science and Technologyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1088/0953-2048/16/12/051en_US
dc.subjectBolometersen_US
dc.subjectCrystalline materialsen_US
dc.subjectEtchingen_US
dc.subjectLanthanum compoundsen_US
dc.subjectMagnesiaen_US
dc.subjectMagnetron sputteringen_US
dc.subjectModulationen_US
dc.subjectPhase transitionsen_US
dc.subjectPulsed laser depositionen_US
dc.subjectSuperconducting filmsen_US
dc.subjectTemperature measurementen_US
dc.subjectYttrium barium copper oxidesen_US
dc.subjectEdge transition bolometersen_US
dc.subjectSuperconductivity transitionen_US
dc.subjectSuperconductivityen_US
dc.titleEffect of the superconductivity transition on the response of YBCO edge transition bolometersen_US
dc.typeConference Paperen_US
dc.departmentDepartment of Electrical and Electronics Engineering
dc.citation.spage1554en_US
dc.citation.epage1558en_US
dc.citation.volumeNumber16en_US
dc.citation.issueNumber12en_US
dc.identifier.doi10.1088/0953-2048/16/12/051en_US


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