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dc.contributor.authorMetan, G.en_US
dc.contributor.authorSabuncuoğlu, İhsanen_US
dc.coverage.spatialOrlando, FL, USAen_US
dc.date.accessioned2016-02-08T11:50:39Z
dc.date.available2016-02-08T11:50:39Z
dc.date.issued2005en_US
dc.identifier.issn0891-7736en_US
dc.identifier.urihttp://hdl.handle.net/11693/27324
dc.descriptionDate of Conference: 4-7 December 2005en_US
dc.descriptionConference Name: 37th Winter Simulation Conference, WSC 2005en_US
dc.description.abstractA simulation based learning mechanism is proposed in this study. The system learns in the manufacturing environment by constructing a learning tree and selects a dispatching rule from the tree for each scheduling period. The system utilizes the process control charts to monitor the performance of the learning tree which is automatically updated whenever necessary. Therefore, the system adapts itself for the changes in the manufacturing environment and works well over time. Extensive simulation experiments are conducted for the system parameters such as monitoring (MPL) and scheduling period lengths (SPL) on a job shop problem with objective of minimizing average tardiness. Simulation results show that the performance of the proposed system is considerably better than the simulation-based single-pass and multi-pass scheduling algorithms available in the literature.en_US
dc.language.isoEnglishen_US
dc.source.titleProceedings of the 37th Winter Simulation Conference, WSC 2005en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/WSC.2005.1574500en_US
dc.subjectAlgorithmsen_US
dc.subjectComputer simulationen_US
dc.subjectOptimizationen_US
dc.subjectProblem solvingen_US
dc.subjectProcess controlen_US
dc.subjectSchedulingen_US
dc.subjectManufacturing environmenten_US
dc.subjectMulti-pass schedulingen_US
dc.subjectSystem parametersen_US
dc.subjectLearning systemsen_US
dc.titleA simulation based learning meachanism for scheduling systems with continuous control and update structureen_US
dc.typeConference Paperen_US
dc.departmentDepartment of Industrial Engineeringen_US
dc.citation.spage2148en_US
dc.citation.epage2156en_US
dc.citation.volumeNumber2005en_US
dc.identifier.doi10.1109/WSC.2005.1574500en_US
dc.publisherIEEEen_US


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