Show simple item record

dc.contributor.authorAydin, K.en_US
dc.contributor.authorBulu I.en_US
dc.contributor.authorOzbay, E.en_US
dc.date.accessioned2016-02-08T11:47:27Z
dc.date.available2016-02-08T11:47:27Z
dc.date.issued2006en_US
dc.identifier.issn8952477en_US
dc.identifier.urihttp://hdl.handle.net/11693/27204
dc.description.abstractImpedance matching at the surface of left-handed materials (LHM) is required for certain applications including a perfect lens. In this study, we present the experimental and theoretical verification of an impedance-matched LHM to free space. Reflection characteristics of both one-dimensional and two-dimensional LHM were investigated. The reflection was observed to be very low at a narrow frequency range. FDTD simulations and retrieval procedures were used to theoretically verify impedance matching. By varying the number of layers along the propagation direction, the ultralow reflection at specific frequencies was shown to be independent of the sample thickness. © 2006 Wiley Periodicals, Inc.en_US
dc.language.isoEnglishen_US
dc.source.titleMicrowave and Optical Technology Lettersen_US
dc.relation.isversionofhttp://dx.doi.org/10.1002/mop.22003en_US
dc.subjectImpedance matchingen_US
dc.subjectLeft-handed materialsen_US
dc.subjectMetamaterialsen_US
dc.subjectPerfect lensen_US
dc.subjectReflectionen_US
dc.subjectComputer simulationen_US
dc.subjectElectromagnetic wave reflectionen_US
dc.subjectFinite difference methoden_US
dc.subjectLensesen_US
dc.subjectNatural frequenciesen_US
dc.subjectTime domain analysisen_US
dc.subjectWave propagationen_US
dc.subjectFDTD simulationsen_US
dc.subjectLeft handed materials (LHM)en_US
dc.subjectMetamaterialsen_US
dc.subjectPerfect lensen_US
dc.subjectImpedance matching (electric)en_US
dc.titleVerification of impedance matching at the surface of left-handed materialsen_US
dc.typeConference Paperen_US
dc.departmentGraduate Program in Materials Science and Nanotechnologyen_US
dc.departmentDepartment of Physics
dc.departmentDepartment of Electrical and Electronics Engineering
dc.citation.spage2548en_US
dc.citation.epage2552en_US
dc.citation.volumeNumber48en_US
dc.citation.issueNumber12en_US
dc.identifier.doi10.1002/mop.22003en_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record