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dc.contributor.authorDede, M.en_US
dc.contributor.authorUrkmen, K.en_US
dc.contributor.authorOral, A.en_US
dc.contributor.authorFarrer I.en_US
dc.contributor.authorRitchie, D.A.en_US
dc.date.accessioned2016-02-08T11:46:07Z
dc.date.available2016-02-08T11:46:07Z
dc.date.issued2006en_US
dc.identifier.urihttp://hdl.handle.net/11693/27156
dc.description.abstract[No abstract available]en_US
dc.language.isoEnglishen_US
dc.source.titleINTERMAG 2006 - IEEE International Magnetics Conferenceen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/INTMAG.2006.376308en_US
dc.titleVariable temperature Scanning Hall Probe Microscopy (SHPM) using quartz crystal AFM feedbacken_US
dc.typeConference Paperen_US
dc.departmentDepartment of Physics
dc.citation.spage584en_US
dc.identifier.doi10.1109/INTMAG.2006.376308en_US


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