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      Synthetic TEC mapping with ordinary and universal kriging

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      Author
      Sayın, I.
      Arıkan, F.
      Arıkan, Orhan
      Date
      2007-06
      Source Title
      Proceedings of the 3rd International Conference on Recent Advances in Space Technologies, RAST 2007
      Publisher
      IEEE
      Pages
      39 - 43
      Language
      English
      Type
      Conference Paper
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      Abstract
      Spatiotemporal variations in the ionosphere affects the HF and satellite communications and navigation systems. Total Electron Content (TEC) is an important parameter since it can be used to analyze the spatial and temporal variability of the ionosphere. In this study, the performance of the two widely used Kriging algorithms, namely Ordinary Kriging (OrK) and Universal Kriging (UnK), is compared over the synthetic data set. In order to represent various ionospheric states, such as quiet and disturbed days, spatially correlated residual synthetic TEC data with different variances is generated and added to trend functions. Synthetic data sampled with various type of sampling patterns and for a wide range of sampling point numbers. It is observed that for small sampling numbers and with higher variability, OrK gives smaller errors. As the sample number increases, UnK errors decrease faster. For smaller variances in the synthetic surfaces, UnK gives better results. For increasing variance and decreasing range values, usually, the errors increase for both OrK and UnK. © 2007 IEEE.
      Keywords
      Aerospace industry
      Errors
      Function evaluation
      Ionosphere
      Ionospheric measurement
      Sampling
      Satellite communication systems
      Statistics
      Telecommunication systems
      (001) parameter
      (min ,max ,+) functions
      In order
      Increasing variance
      international conferences
      Kriging
      Ordinary kriging (OK)
      Sample number
      Sampling patterns
      Sampling points
      Satellite communications
      Small sampling
      Space technology (ST)
      Spatial and temporal variability
      Spatially correlated
      Spatio-temporal variations
      Synthetic data
      Synthetic data sets
      Synthetic surfaces
      Total electron content (TEC)
      Universal kriging
      Wide-range
      Error analysis
      Permalink
      http://hdl.handle.net/11693/26929
      Published Version (Please cite this version)
      http://dx.doi.org/10.1109/RAST.2007.4284019
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      • Department of Electrical and Electronics Engineering 3524
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