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dc.contributor.authorSüzer, Ş.en_US
dc.contributor.authorVoscoboinikov, T.en_US
dc.contributor.authorHallam, K. R.en_US
dc.contributor.authorAllen, G. C.en_US
dc.date.accessioned2016-02-08T10:49:43Z
dc.date.available2016-02-08T10:49:43Z
dc.date.issued1996en_US
dc.identifier.issn0937-0633
dc.identifier.urihttp://hdl.handle.net/11693/25733
dc.description.abstractFloat glasses of different thicknesses and a conducting tin oxide glass have been investigated using Photo and Auger Electron Spectroscopy induced by AlKα X-rays. On the basis of measured chemical XPS shifts in the binding energies the chemical state of Sn (+2 or +4) incorporated on the float glasses could not be assigned. The use of the Auger parameter allows to separate relaxation and chemical contributions. The derived true chemical shifts of Sn on float-glasses are larger than those of SnO and/or SnO2 due to the larger ionic environment of the glass matrix. Ar+ or HF etching reveals that the concentration of Sn decreases exponentially as a function of depth from the surface. © Springer-Verlag 1996.en_US
dc.language.isoEnglishen_US
dc.source.titleFresenius' Journal of Analytical Chemistryen_US
dc.relation.isversionofhttp://doi.org/10.1007/s0021663550654en_US
dc.subjectAuger electron spectroscopyen_US
dc.subjectCoatingsen_US
dc.subjectMetalsen_US
dc.subjectTinen_US
dc.subjectChemical shiften_US
dc.subjectCoordination numberen_US
dc.subjectFloat glassen_US
dc.subjectPhotoelectron emissionen_US
dc.subjectThin filmsen_US
dc.titleElectron spectroscopic investigation of Sn coatings on glassesen_US
dc.typeArticleen_US
dc.departmentDepartment of Chemistryen_US
dc.citation.spage654en_US
dc.citation.epage656en_US
dc.citation.volumeNumber355en_US
dc.citation.issueNumber5-6en_US
dc.identifier.doi10.1007/s0021663550654en_US
dc.publisherSpringeren_US


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