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dc.contributor.authorTasci, T. O.en_US
dc.contributor.authorAtalar, E.en_US
dc.contributor.authorDemirok, U. K.en_US
dc.contributor.authorSuzer, S.en_US
dc.date.accessioned2016-02-08T10:10:50Z
dc.date.available2016-02-08T10:10:50Z
dc.date.issued2008en_US
dc.identifier.issn0039-6028
dc.identifier.urihttp://hdl.handle.net/11693/23248
dc.description.abstractWe model the X-ray photoelectron spectrometer and the sample with lumped electrical circuit elements, and simulate various types of conditions using a widely used computer program (PSpice) and compare the results with experimental measurements. By using the electrical model simulations, the surface voltage and the spectrum can be estimated under various types of external voltage stimuli, and the zero potential condition can be predicted accurately for obtaining a truly uncharged spectrum. Additionally, effects of several charging mechanisms (taking place during XPS measurements) on the surface potential could easily be assessed. Finally, the model enables us to find electrical properties, like resistance and capacitance of surface structures, under X-ray and low-energy electron exposure.en_US
dc.language.isoEnglishen_US
dc.source.titleSurface Scienceen_US
dc.relation.isversionofhttp://doi.org/10.1016/j.susc.2007.10.041en_US
dc.subjectX-ray photoelectron spectroscopyen_US
dc.subjectDifferential chargingen_US
dc.subjectModeling and simulationen_US
dc.subjectSilicon dioxide layersen_US
dc.subjectResistance and capacitanceen_US
dc.titleElectrical circuit modeling of surface structures for X-ray photoelectron spectroscopic measurementsen_US
dc.typeArticleen_US
dc.department
dc.department
dc.departmentInstitute of Materials Science and Nanotechnology (UNAM)en_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.departmentDepartment of Chemistryen_US
dc.departmentNational Magnetic Resonance Research Center (UMRAM)en_US
dc.citation.spage365en_US
dc.citation.epage368en_US
dc.citation.volumeNumber602en_US
dc.citation.issueNumber1en_US
dc.identifier.doi10.1016/j.susc.2007.10.041en_US
dc.publisherElsevier BV * North-Hollanden_US


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