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dc.contributor.authorSelçuk, A. A.en_US
dc.date.accessioned2016-02-08T10:10:36Z
dc.date.available2016-02-08T10:10:36Z
dc.date.issued2008-01en_US
dc.identifier.issn0933-2790
dc.identifier.urihttp://hdl.handle.net/11693/23230
dc.description.abstractDespite their widespread usage in block cipher security, linear and differential cryptanalysis still lack a robust treatment of their success probability, and the success chances of these attacks have commonly been estimated in a rather ad hoc fashion. In this paper, we present an analytical calculation of the success probability of linear and differential cryptanalytic attacks. The results apply to an extended sense of the term "success" where the correct key is found not necessarily as the highest-ranking candidate but within a set of high-ranking candidates. Experimental results show that the analysis provides accurate results in most cases, especially in linear cryptanalysis. In cases where the results are less accurate, as in certain cases of differential cryptanalysis, the results are useful to provide approximate estimates of the success probability and the necessary plaintext requirement. The analysis also reveals that the attacked key length in differential cryptanalysis is one of the factors that affect the success probability directly besides the signal-to-noise ratio and the available plaintext amount. © 2007 International Association for Cryptologic Research.en_US
dc.language.isoEnglishen_US
dc.source.titleJournal of Cryptologyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1007/s00145-007-9013-7en_US
dc.subjectBlock ciphersen_US
dc.subjectDifferential cryptanalysisen_US
dc.subjectLinear cryptanalysisen_US
dc.subjectOrder statisticsen_US
dc.subjectSuccess probabilityen_US
dc.subjectBlock codesen_US
dc.subjectIntrusion detectionen_US
dc.subjectNetwork securityen_US
dc.subjectProbability distributionsen_US
dc.subjectSignal to noise ratioen_US
dc.subjectCryptographyen_US
dc.titleOn probability of success in linear and differential cryptanalysisen_US
dc.typeArticleen_US
dc.departmentDepartment of Computer Engineering
dc.citation.spage131en_US
dc.citation.epage147en_US
dc.citation.volumeNumber21en_US
dc.citation.issueNumber1en_US
dc.identifier.doi10.1007/s00145-007-9013-7en_US
dc.publisherSpringer New York LLCen_US


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