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dc.contributor.authorAksun, M. I.en_US
dc.contributor.authorAlparslan, A.en_US
dc.contributor.authorKarabulut, E.P .en_US
dc.contributor.authorIrci, E.en_US
dc.contributor.authorErtürk, V. B.en_US
dc.date.accessioned2016-02-08T10:08:54Z
dc.date.available2016-02-08T10:08:54Z
dc.date.issued2008en_US
dc.identifier.issn0018-9480
dc.identifier.urihttp://hdl.handle.net/11693/23098
dc.description.abstractA novel approach to find the effective electric and magnetic parameters of finite periodic structures is proposed. The method uses the reflection coefficients at the interface between a homogenous half-space and the periodic structure of different thicknesses. The reflection data are then approximated by complex exponentials, from which one can deduce the wavenumber, and the effective electric and magnetic properties of the equivalent structure by a simple comparison to the geometrical series representation of the generalized reflection from a homogenous slab. Since the effective parameters are for the homogenous equivalent of the periodic structure, the results obtained are expected to be independent of the number of unit cells used in the longitudinal direction. Although the proposed method is quite versatile and applicable to any finite periodic structure, photonic crystals and metamaterials with metallic inclusions have been used to demonstrate the application of the method in this paper.en_US
dc.language.isoEnglishen_US
dc.source.titleIEEE Transactions on Microwave Theory and Techniquesen_US
dc.relation.isversionofhttp://doi.org/10.1109/TMTT.2008.923870en_US
dc.subjectEffective constitutive parametersen_US
dc.subjectHomogenizationen_US
dc.subjectMetamaterialsen_US
dc.subjectPhotonic crystalsen_US
dc.titleDetermining the effective constitutive parameters of finite periodic structures: Photonic crystals and metamaterialsen_US
dc.typeArticleen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spage1423en_US
dc.citation.epage1434en_US
dc.citation.volumeNumber56en_US
dc.citation.issueNumber6en_US
dc.identifier.doi10.1109/TMTT.2008.923870en_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.identifier.eissn1557-9670


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