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dc.contributor.authorAtabak, M.en_US
dc.contributor.authorÜnverdi O.en_US
dc.contributor.authorÖzer H.O.en_US
dc.contributor.authorOral, A.en_US
dc.date.accessioned2016-02-08T10:04:34Z
dc.date.available2016-02-08T10:04:34Z
dc.date.issued2009en_US
dc.identifier.issn10711023
dc.identifier.urihttp://hdl.handle.net/11693/22773
dc.description.abstractIn this work, the authors report on a quantitative investigation of lateral-force gradient and lateral force between a tungsten tip and Si (111) - (7×7) surface using combined noncontact lateral-force microscopy and scanning tunneling microscopy. Simultaneous lateral-force gradient and scanning tunneling microscopy images of single and multiatomic step are obtained. In our measurement, tunnel current is used as feedback. The lateral-stiffness contrast has been observed to be 2.5 Nm at a single atomic step, in contrast to 13 Nm at a multiatomic step on Si (111) surface. They also carried out a series of lateral stiffness-distance spectroscopy, which show a sharp increase in tip-surface interaction stiffness as the sample is approached toward the surface. © 2009 American Vacuum Society.en_US
dc.language.isoEnglishen_US
dc.source.titleJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structuresen_US
dc.relation.isversionofhttp://dx.doi.org/10.1116/1.3097857en_US
dc.subjectAtomic forcesen_US
dc.subjectAtomic stepsen_US
dc.subjectForce gradientsen_US
dc.subjectLateral forcesen_US
dc.subjectLateral stiffnessen_US
dc.subjectLateral-force microscopiesen_US
dc.subjectNoncontacten_US
dc.subjectOff resonancesen_US
dc.subjectQuantitative investigationsen_US
dc.subjectSharp increaseen_US
dc.subjectSi (1 1 1)en_US
dc.subjectTip-surface interactionsen_US
dc.subjectTungsten tipsen_US
dc.subjectTunnel currentsen_US
dc.subjectScanningen_US
dc.subjectScanning tunneling microscopyen_US
dc.subjectSiliconen_US
dc.subjectTungstenen_US
dc.subjectStiffnessen_US
dc.titleNoncontact lateral-force gradient measurement on Si(111)-7×7 surface with small-amplitude off-resonance atomic force microscopyen_US
dc.typeArticleen_US
dc.departmentDepartment of Physics
dc.citation.spage1001en_US
dc.citation.epage1005en_US
dc.citation.volumeNumber27en_US
dc.citation.issueNumber2en_US
dc.identifier.doi10.1116/1.3097857en_US


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